At the IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) 2024 held in Springfield, Massachusetts, USA, August 11 – 14, 2024, Ph.D. candidate, Mr. Chen, presented his research (presentation date: August 14).
The following paper has been accepted for A-SSCC 2024. We will present the results in November in Hiroshima.
Q. Cheng, L. Lin, M. Huang, Q. Li, Z. Yang, L. Dai, H. Yu, Y-J. Chen, Y. Shi, and M. Hashimoto, “A 13-34 TOPS/W Edge-Ai Processor Featuring Booth-Value-Confined Accelerator, Near-Memory Computing, and Contiguity-Aware Mapping,” Technical Digest of Asian Solid-State Circuits Conference (A-SSCC), to appear.
The following paper has been accepted for ICCD 2024. We will present the results in Milan, Italy, in November.
M. Zhang, Q. Cheng, H. Awano, L. Lin, and M. Hashimoto, “S3M: Static Semi-Segmented Multipliers for Energy-Efficient DNN Inference Accelerators,” Proceedings of IEEE International Conference on Computer Design (ICCD), to appear.
The following two talks were given at the ACM/IEEE Design Automation Conference (DAC) 2024, a top conference on integrated circuit design, held in San Francisco, USA, July 23-27, 2024 (presentation dates: July 25 (Koike) and 26 (Hashimoto)).
A research paper on PUF was presented at the IEEE International Symposium on Hardware Oriented Security and Trust (HOST) 2024 in Washington, DC, USA, May 6-9, 2024 (presentation date: May 9, 2024).
The following papers have been accepted for the European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2024, scheduled to be held in Canary Islands, Spain, in September 2024:
Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, “Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), (accepted, to appear).
K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, “Validating Terrestrial SER in 12- and 28-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), (accepted, to appear).
K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, and H. Shindo, “Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), (accepted, to appear).
Sorry, this entry is only available in 日本語.
Sorry, this entry is only available in 日本語.
M1 student Koike and faculty member Sato presented the following research at the Design, Automation and Test in Europe Conference (DATE) 2024 held in Valencia, Spain, on March 25-27, 2024 (presentation dates: March 25 and 27, respectively) Dr. Hashimoto served as a panelist at the Focus session “Resilience of Deep Learning Applications: Where We Are and Where We Want to Go” (March 27th).
The following paper has been accepted for presentation at the IEEE International Conference on Microelectronic Test Structures (ICMTS), to be held in Edinburgh, Scotland, UK, in April 2024. This work is the result of joint research with Kyoto Institute of Technology.