DAC2023

At the Design Automation Conference (DAC) held July 9-13, 2023 in San Francisco, California, USA, Ikeda (M2) gave a poster presentation in the WIP session.

S. Ikeda, H. Awano, and T. Sato, “No-NL DFR: New model of digital delayed feedback reservoir without nonlinear elements”

SSDM 2023: Paper accepted

The following paper has been accepted for presentation at the International Conference on Solid State Devices and Materials (SSDM) 2022. This work is the result of joint research with National Institute of Advanced Industrial Science and Technology (AIST).

  • H. Urabe, K. Oshima, and T. Sato, “Feasibility study of PLL-based analog-to-digital converter for low-voltage organic thin-film transistors,” in Proc. International Conference on Solid State Devices and Materials (SSDM), September 2023. (to appear)
  • K. Kuribara, A. Takei, T. Sato, and M. Yoshida, “Low voltage operation of organic thin-film transistor with atmospheric coating of high-k polymer dielectric,” in Proc. International Conference on Solid State Devices and Materials (SSDM), September 2023. (to appear)

Paper accepted: ACM TECS

The following paper has been accepted for publication in ACM Transactions on Embedded Computing Systems (TECS). This research will be presented orally at the International Conference on Compilers, Architectures, and Synthesis for Embedded Systems (CASES), one of the international conferences comprising Embedded System Week (ESWeek), to be held in Hamburg, Germany, in September 2023.

Sosei Ikeda, Hiromitsu Awano, and Takashi Sato, “Modular DFR: Digital delayed feedback reservoir model for enhancing design flexibility,” ACM Transactions on Embedded Computing Systems (TECS), accepted for publication.

Paper accepted: ITC 2023

The following paper has been accepted for the International Test Conference (ITC 2023) to be held in Anaheim, USA, in October 2023. This work is the outcome of joint research with Sony Semiconductor Manufacturing, Kyoto Institute of Technology, and Nara Institute of Science and Technology.

Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Takashi Sato and Michihiro Shintani, “Improving efficiency and robustness of Gaussian process based outlier detection via ensemble learning,” in Proc. International Test Conference (ITS) 2023, to appear.