Month: March 2024

Publication

Paper accepted: IEEE Transactions on Nuclear Science

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The following paper has been accepted for publication in the IEEE Transactions on Nuclear Science. This study is a collaborative research effort involving Kyushu University, National Institute of Advanced Industrial Science and Technology, Kochi University of Technology, Japan Atomic Energy Agency, and High Energy Accelerator Research Organization.

Y. Deng, Y. Watanabe, S. Manabe, W. Liao, M. Hashimoto, S. Abe, M. Tampo, and Y. Miyake, “Impact of Irradiation Side on Muon-Induced Single Event Upsets in 65-nm Bulk SRAMs,” in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2024.3378216 in press.

Award

SASIMI 2024 Outstanding Paper Award

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Two papers were presented at SASIMI2024, held in Taipei, Taiwan, on March 10-11, 2024, and Koike-kun’s paper received the Outstanding Paper Award.

  • Takefumi Koike and Takashi Sato, “Enhancing visual similarities in DNA-based similar image retrieval,” in Proc. Workshop on synthesis and system integration of mixed information technologies (SASIMI), pp.87-92, March 2024.
Award

IEICE VLD Excellent Student Author Award for ASP-DAC 2024

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Oshima-kun and Suemitsu-kun received the IEICE VLD Excellent Student Author Award for ASP-DAC 2024 at the IEICE VLD meeting held between February 28 and March 2, 2024. They also delivered memorial lectures at the meeting.

  • “Design of Aging-Robust Clonable PUF Using an Insulator-Based ReRAM for Organic Circuits,” Kunihiro Oshima, Kazunori Kuribara, Takashi Sato, IEICE Tech. Rep., vol. 123, no. 390, VLD2023-116, pp. 98-98, Feb. 2024.
  • “Logic Locking over TFHE for Securing User Data and Algorithms,” Kohei Suemitsu, Kotaro Matsuoka, Takashi Sato, and Masanori Hashimoto, IEICE Tech. Rep., vol. 123, no. 390, VLD2023-118, pp. 100-100, Feb. 2024.
Conference / Workshop

(日本語) ICMTS2024採録決定

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The following paper has been accepted for presentation at the IEEE International Conference on Microelectronic Test Structures (ICMTS), to be held in Edinburgh, Scotland, UK, in April 2024. This work is the result of joint research with Kyoto Institute of Technology.

  • Michihiro Shintani, Tetsuro Iwasaki, and Takashi Sato, “Gaussian process-based device model toward a unified current model across room to cryogenic temperatures,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), April 2024. (to appear)