Sorry, this entry is only available in 日本語.
Category: Conference / Workshop
(日本語) FLEPS2023 採択決定
The following paper has been accepted for the IEEE International Conference on Flexible, Printable Sensors and Systems (FLEPS 2023) to be held in Boston, USA, in July 2023. This research results from joint research with the National Institute of Advanced Industrial Science and Technology (AIST).
Qin Zhaoxing, Kunihiro Oshima, Kazunori Kuribara, and Takashi Sato, “OPTL: Robust and area-efficient pass gate logic for organic transistors,” in Proc. IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS), to appear.
IRPS 2023
Kazusa Takami gave a poster presentation at International Reliability Physics Symposium (IRPS) on March 29, held in Monterey CA, USA from March 26 to 30, 2023.
K. Takami, Y. Gomi, S. Abe, W. Liao, S. Manabe, T. Matsumoto, and M. Hashimoto, “Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons,” Proceedings of International Reliability Physics Symposium (IRPS), 2023.
ICMTS2023
Niiyama-kun (M1) presented his research at International Conference on Microelectronic Test Structures (ICMTS 2023) held at the University of Tokyo from March 27 to 30, 2023.
- K. Niiyama, H. Awano, and T. Sato, “Introducing transfer learning framework on device modeling by machine learning,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), pp.158-163, March 2023.
ACM IUI 2023
Harimaya gave a poster presentation at 28th Annual Conference on Intelligent User Interfaces (ACM IUI) held in Sydney, Australia on March 26–31, 2023.
M. Harimaya, R. Shirai, and M. Hashimoto, “Toward Instant 3D Modeling: Highly Parallelizable Shape Reproduction Method for Soft Object Containing Numerous Tiny Position Trackers,”in Companion Proceedings of the 28th International Conference on Intelligent User Interfaces (IUI), pp. 130–133, March 2022.
IRPS 2023
The following paper has been accepted. It is the result of joint research with JAEA, the University of Tokyo, and AIST, and will be presented in Monterey, CA in March 2023.
K. Takami, Y. Gomi, S. Abe, W. Liao, S. Manabe, T. Matsumoto, and M. Hashimoto, “Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons,” Proceedings of International Reliability Physics Symposium (IRPS), to appear.
ATS 2022
Professor Sato gave an invited talk at the Asian Test Symposium (ATS) hybrid held on 11/21-11/23 at Evergreen Laurel Hotel, Taichung, Taiwan (2022/11/23).
“Evaluation of device characteristic changes in X-ray inspection”.