The paper below has been accepted by IEEE Solid-State Circuits Letters.
Y. Gomi, A. Sato, W. Madany, K. Okada, S. Adachi, M. Itoh, and M. Hashimoto, “A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement,” in IEEE Solid-State Circuits Letters, doi: 10.1109/LSSC.2025.3589611.
This paper, a collaborative research outcome with Hitachi, Ltd., has been accepted by IEEE Access.
H. Itsuji, T. Uezono, T. Toba, K. Ito and M. Hashimoto, “A Hardware-Aware Failure-Detection Method for GPU Control-Logic,” in IEEE Access, vol. 13, pp. 113890-113904, 2025, doi: 10.1109/ACCESS.2025.3584759.
The following two research presentations were delivered at the ACM/IEEE Design Automation Conference (DAC) 2025, held in San Francisco, USA, from June 22 to June 25, 2025. The presentations were given on June 23 (Guo) and June 24 (Tagata), respectively. DAC is a premier conference in the field of integrated circuit design.
The following paper has been accepted for publication in IEEE Sensors Letters:
Ryosuke Sada, Toshihisa Tanaka, Hisafumi Asaue, Tomoki Shiotani, Masanori Hashimoto, and Ryo Shirai, “Localization of Embedded Sensors in Reinforced Concrete via Time-Series Magnetic Field Sensing and Maximum Likelihood Estimation,” IEEE Sensors Letters, accepted, to appear.
We will also present this work at the IEEE Sensors Conference 2025, which will be held in Vancouver, Canada.
This work was conducted in collaboration with the Laboratory on Innovation for Infrastructures (ITIL), Office of Institutional Advancement and Communications, Kyoto University.
The following paper has been published at IACR TCHES. This paper is a collaborative work with Tohoku University, NTT Social Informatics Laboratories, and NEC. The paper will be presented at International Conference on Cryptographic Hardware and Embedded Systems (CHES) in September 2025.
Rei Ueno, Akira Ito, Yosuke Todo, Akiko Inoue, Kazuhiko Minematsu, Hibiki Ishikawa, and Naofumi Homma, “All You Need is XOR-Convolution: A Generalized Higher-Order Side-Channel Attack with Application to XEX/XE-based Encryptions,” IACR Transactions on Cryptographic Hardware and Embedded Systems, 2025(3), pp. 317-360, 2025. https://doi.org/10.46586/tches.v2025.i3.317-360
The following paper has been accepted for publication in IEEE Transactions on Device and Materials Reliability.
Shufan Xu, Kunyang Liu, Kiichi Niitsu and Hirofumi Shinohara, “Statistical Model and Transistor Size Effect of Hot Carrier Injection for Stability Reinforced SRAM Physically Unclonable Function,” IEEE Transactions on Device and Materials Reliability, doi: 10.1109/TDMR.2025.3574796.
The following paper has been accepted for publication in IEEE Transactions on Electron Devices. This research is the result of a collaborative study with Kyoto Institute of Technology.
The following paper has been accepted for publication in IEEE Transactions on Nuclear Science. This work is the research achievement of Dr. Takeuchi, who received his Ph.D. degree in September 2024.”
K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, H. Shindo, “Cross-section Prediction Method for Proton Direct Ionization Induced Single Event Upset,” in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2025.3568455.
This paper has been accepted to IEEE Transactions on Nuclear Science. It is the result of research conducted by Dr. Yang Li during his one-year stay as a special research student.
Yang Li, Masakazu Yoshida, Yuibi Gomi, Yifan Deng, Yukinobu Watanabe, Satoshi Adachi, Masatoshi Itoh, Guohe Zhang, Chaohui He, and Masanori Hashimoto, “Experimental Study of Proton-Induced Radiation Effects on DDR5 Modules,” in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2025.3565125.
The following paper has been accepted for publication in the IEEE Sensors Journal.
Ryota Fukugasako, Hisafumi Asaue, Tomoki Shiotani, Masanori Hashimoto, and Ryo Shirai, “A Current Chopper-assisted Magnetic Field-based Backscatter Communication Method with WPT Overcoming Ultra-low Coupling Coefficients,” in IEEE Sensors Journal, doi: 10.1109/JSEN.2025.3555072.