Press Release: Advancements in Accelerating Reliability Evaluation of Electronic Devices – Development of Technology Enabling Semiconductor Soft Error Evaluation in Various Neutron Facilities

Regarding the research achievements of JST OPERA, a joint press release was conducted on June 5, 2023, by the Japan Atomic Energy Agency, Socionext Inc., HIREC Corporation, Kyoto Institute of Technology, and Kyushu University.

With this method, it becomes possible to evaluate soft error rates using numerous general neutron sources both domestically and internationally, without the need for limited special neutron sources. This enables meeting the increasing demand for soft error rate evaluation.

This press release is based on the paper below.

S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, and Y. Watanabe, “A Terrestrial SER Estimation Methodology Based on Simulation Coupled with One-Time Neutron Irradiation Testing,” IEEE Transactions on Nuclear Science, in early access.
DOI: 10.1109/TNS.2023.3280190

Relatedly, it was covered by EE Times Japan on June 7, 2023.

Press Release (Socionext and Partners Clarify Differences between Semiconductor Soft Errors Caused by Cosmic-Ray Muons and Neutrons)

Socionext Inc., High Energy Accelerator Research Organization, Kyoto University, and Osaka University issued a press release regarding the joint project performed with Socionext Inc at Osaka University (July 16th, 2021).

The paper below is the base publication for this press release.

T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake, “Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles,” IEEE Transactions on Nuclear Science, 68(7), pp. 1436-1444, July 2021.