JST CRONOS

新津研究グループの研究課題が国立研究開発法人 科学技術振興機構 戦略的創造研究推進事業 情報通信科学・イノベーション基盤創出(JST CRONOS)に採択されました。
Niitsu Group’s research proposal is accepted to JST CRONOS!

研究課題名『動的環境順応時空間拡張に資する半導体共進化微細IoT』

JST Press Release

新津研究グループの研究が国立研究開発法人 科学技術振興機構にプレスリリースされました。

Niitsu Group’s research has been published in a press release to Japan Science and Technology Advancement (JST)!

Hiroaki Kitaike, Masaharu Inada, Mitsuru Terauchi, Hironori Tagawa, Ryosuke Nagai, Shufan Xu, Ruilin Zhang, Kunyang Liu, and Kiichi Niitsu, “A 0.9-2.6pW 0.1-0.25V 22nm 2-bit Supply-to-Digital Converter Using Always-Activated Supply-Controlled Oscillator and Supply-Dependent-Activation Buffers for Bio-Fuel-Cell-Powered-and-Sensed Time-Stamped Bio-Recording”

https://www.jst.go.jp/pr/announce/20240617/index.html

Press Release: Advancements in Accelerating Reliability Evaluation of Electronic Devices – Development of Technology Enabling Semiconductor Soft Error Evaluation in Various Neutron Facilities

Regarding the research achievements of JST OPERA, a joint press release was conducted on June 5, 2023, by the Japan Atomic Energy Agency, Socionext Inc., HIREC Corporation, Kyoto Institute of Technology, and Kyushu University.

With this method, it becomes possible to evaluate soft error rates using numerous general neutron sources both domestically and internationally, without the need for limited special neutron sources. This enables meeting the increasing demand for soft error rate evaluation.

This press release is based on the paper below.

S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, and Y. Watanabe, “A Terrestrial SER Estimation Methodology Based on Simulation Coupled with One-Time Neutron Irradiation Testing,” IEEE Transactions on Nuclear Science, in early access.
DOI: 10.1109/TNS.2023.3280190

Relatedly, it was covered by EE Times Japan on June 7, 2023.

Press Release (Socionext and Partners Clarify Differences between Semiconductor Soft Errors Caused by Cosmic-Ray Muons and Neutrons)

Socionext Inc., High Energy Accelerator Research Organization, Kyoto University, and Osaka University issued a press release regarding the joint project performed with Socionext Inc at Osaka University (July 16th, 2021).

https://www.socionext.com/en/pr/sn_pr20210716_01e.pdf

https://www.kek.jp/en/press-en/20210715/

https://www.kyoto-u.ac.jp/en/research-news/2021-07-19

https://resou.osaka-u.ac.jp/ja/research/2021/20210716_2

The paper below is the base publication for this press release.

T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake, “Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles,” IEEE Transactions on Nuclear Science, 68(7), pp. 1436-1444, July 2021.