Accepted for publication in IEEE Transactions on Nuclear Science

The research results of the joint research with Kochi University of Technology conducted within the framework of OPERA will be published in IEEE Transactions on Nuclear Science.

T. Tanaka, W. Liao, M. Hashimoto, and Y. Mitsuyama, “Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: from Bit Upset to SEFI and Erroneous Behavior,” IEEE Transactions on Nuclear Science, accepted for publication.

Paper accepted: ACM Workshop on Encrypted Computing & Applied Homomorphic Cryptography (WAHC)

The following paper has been accepted for presentation in ACM Workshop on Encrypted Computing & Applied Homomorphic Cryptography (WAHC).

  • Kotaro Matsuoka, Yusuke Hoshizuki, Takashi Sato and Song Bian, “Towards better standard cell library: Optimizing compound logic gates for TFHE,” in Proc. ACM Workshop on Encrypted Computing & Applied Homomorphic Cryptography (WAHC), pp.1-4, November 2021. 10.1145/3474366.3486927

Invited talk on statistical circuit simulation

On November 11, 2021, Prof. Sato gave the following invited talk on statistical circuit simulation at a workshop jointly organized by the Silicon Materials and Devices (SDM) Society of the Institute of Electronics, Information and Communication Engineers (IEICE) and the Silicon Technology Section of the Japan Society of Applied Physics.

  • Takashi Sato, Hiroki Tsukamoto, Song Bian, and Michihiro Shintani, “Non-normal model parameter generation for variation-aware circuit simulation (invited),” IEICE Technical report, SDM2021-54, vol. 121, no. 235, pp.7-12, November 2021.

Accepted for DATE 2022

The paper below is accepted for Design, Automation and Test in Europe Conference (DATE). This research was performed as the joint project with Hitachi Ltd.

Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto, “Estimating Vulnerability of All Model Parameters in DNN with a Small Number of Fault Injections,” Proceedings of Design, Automation and Test in Europe Conference (DATE), to appear.