The following paper has been accepted to International Test Conference (ITC), which will be held in San Diego, California, USA in September 2025.
Q. Cheng, H. Chi, C. Liang, Y. Chao, H. Zhang, Y. Liang, M. Zhang, W. Liao, J. Xiong, J. Liou, M. Hashimoto, and L. Lin, “Genshin: a Generalized Framework with Software-Hardware Co-Design and Pruned Fault Injection for Reliability Analysis,” Proceedings of International Test Conference (ITC), to appear.
