M1 Kitaike-Kun was awarded 2024 Kyoto University President’s Award!
Category: Award
IEEE EDS Japan Chapter Student Award (VLSI)
M1 Kitaike-Kun was awarded IEEE EDS Japan Chapter Student Award (VLSI)!
M1北池君がIEEE EDS Japan Chapter Student Award (VLSI)を受賞されました。
Hiroaki Kitaike, “A 0.9-2.6pW 0.1-0.25V 22nm 2-bit Supply-to-Digital Converter Using Always- Activated Supply-Controlled Oscillator and Supply-Dependent-Activation Buffers for Bio-Fuel-Cell-Powered-and-Sensed Time-Stamped Bio-Recording”, IEEE EDS Japan Chapter Student Award (VLSI), Feb.2025.
ASP-DAC2025
At Asia and South Pacific Design Automation Conference (ASP-DAC 2025) held at the National Museum of Emerging Science and Innovation (Miraikan) in Japan from January 20 to January 23, 2025, the following members made presentation:
- Masanori Hashimoto, Ryuichi Yasuda, Kazusa Takami, Yuibi Gomi, Kozo Takeuchi, “ML-assisted SRAM Soft Error Rate Characterization: Opportunities and Challenges,” in Proc. ACM/IEEE Asia and South Pacific Design Automation Conference (ASPDAC), pp.379-384, January 2025.
- Tomonari Tanaka, Takumi Uezono, Kohei Suenaga, Masanori Hashimoto, “Hardware Error Detection with In-Situ Monitoring of Control Flow-Related Specifications,” in Proc. ACM/IEEE Asia and South Pacific Design Automation Conference (ASPDAC), pp.966-973, January 2025.
- Takuma Kawakami, Takashi Sato, Hiromitsu Awano, “Random Telegraph Noise Observed on 65-nm Bulk pMOS Transistors at 3.8K,” in Proc. ACM/IEEE Asia and South Pacific Design Automation Conference (ASPDAC), pp.1438-1443, January 2025.
Additionally, the following poster presentations were made during the co-located Work-in-Progress session:
- Masami Utsunomiya, Hiroya Murata, Hiromitsu Awano, Takashi Sato, “Hardware Reservoir Using Transistor Variation Based on a 180nm Node Prototype Chip.”
- Wakahiro Ohara, Takashi Sato, Hiromitsu Awano, “Cryo-CMOS Surface Code Decoder for Fault-Tolerant Quantum Computers.”
- Ryuichi Yasuda, Kazusa Takami, Yuibi Gomi, Kozo Takeuchi, Masanori Hashimoto, “Event-Wise Accurate Single-Event Upset Discrimination with Active Learning and Adaptive Hyperparameter Tuning.”
The first poster presentation received the Poster Award, and the second poster presentation won the Best Poster Award.
ASP-DAC 2025 Best Design Award
M1 Kitaike-Kun was awarded the Best Design Award at ACM/IEEE Asia and South Pacific Design Automation Conference (ASP-DAC) 2025!
M1北池君がACM/IEEE Asia and South Pacific Design Automation Conference (ASP-DAC) 2025においてBest Design Awardを受賞されました。
Hiroaki Kitaike, Hironori Tagawa, Shufan Xu, Ruilin Zhang, Kunyang Liu and Kiichi Niitsu, “Design of 0.9-2.6p W 0.1-0.25V 22m 2-bit Supply-to-Digital Converter Using Always-Activated Supply-Controlled Oscillator and Supply-Dependent-Activation Buffers for Bio-Fuel-Cell-Powered-and-Sensed Time-Stamped Bio-Recording”
SASIMI 2024 Outstanding Paper Award
Two papers were presented at SASIMI2024, held in Taipei, Taiwan, on March 10-11, 2024, and Koike-kun’s paper received the Outstanding Paper Award.
- Takefumi Koike and Takashi Sato, “Enhancing visual similarities in DNA-based similar image retrieval,” in Proc. Workshop on synthesis and system integration of mixed information technologies (SASIMI), pp.87-92, March 2024.
IEICE VLD Excellent Student Author Award for ASP-DAC 2024
Oshima-kun and Suemitsu-kun received the IEICE VLD Excellent Student Author Award for ASP-DAC 2024 at the IEICE VLD meeting held between February 28 and March 2, 2024. They also delivered memorial lectures at the meeting.
- “Design of Aging-Robust Clonable PUF Using an Insulator-Based ReRAM for Organic Circuits,” Kunihiro Oshima, Kazunori Kuribara, Takashi Sato, IEICE Tech. Rep., vol. 123, no. 390, VLD2023-116, pp. 98-98, Feb. 2024.
- “Logic Locking over TFHE for Securing User Data and Algorithms,” Kohei Suemitsu, Kotaro Matsuoka, Takashi Sato, and Masanori Hashimoto, IEICE Tech. Rep., vol. 123, no. 390, VLD2023-118, pp. 100-100, Feb. 2024.
RADECS 2023
From September 25-29, 2023, the European Conference on Radiation and Its Effects on Components and Systems (RADECS 2023) was held in Toulouse, France. Research presentations were given by Mr. Gomi (a second-year master’s student) and Mr. Yoshida (a first-year master’s student) on the 27th and 28th, respectively. Mr. Gomi was awarded the Best Student Abstract Awards (2023/10/26).
Y. Gomi, K. Takami, R. Mizuno, M. Niikura, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, I. Umegaki, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, “Muon-Induced SEU Cross Sections of 12-nm FinFET and 28-nm Planar SRAMs,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), to appear.
M. Yoshida, R. Iwamoto, M. Itoh, and M. Hashimoto, “Stuck Errors in Bits and Blocks in GDDR6 under High-Energy Neutron Irradiation,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), to appear.