Best Paper Award, the Virtual Reality Society of Japan

Assistant Prof. Shirai received Best Paper Award from the Virtual Reality Society of Japan regarding the paper below (2021/9/13).

Y. Itoh, Y. Ishihara, R. Shirai, K. Fujita, K. Takashima, and T. Onoye, “StickyTouch: A Touch Display with Controllable Local Adhesion,” Transactions of the Virtual Reality Society of Japan (in Japanese), Vol. 25, No. 4, pp. 384-393, 2020.

Paper accepted: Transactions of the Virtual Reality Society of Japan

The paper below has been accepted by Transactions of the Virtual Reality Society of Japan. The first author is Ms. Suzunaga who completed master’s degree at Osaka University in March 2021. This work was carried out at Osaka University with Tohoku University,

S. Suzunaga, K. Fujita, R. Shirai, and Y. Itoh, “CoiLED Display: Striped Flexible Displays Windable Around Objects, ” Transactions of the Virtual Reality Society of Japan (in Japanese), accepted, to appear.

Paper accepted: IEEE Journal of Solid-State Circuits

The paper below has been accepted for publication by IEEE Journal of Solid-State Circuits.
This research is a result of the CREST project on via-switch FPGA.

X. Bai, N. Banno, M. Miyamura, R. Nebashi, K. Okamoto, H. Numata, N. Iguchi, M. Hashimoto, T. Sugibayashi, T. Sakamoto, and M. Tada, “Via-Switch FPGA: 65nm CMOS Implementation and Evaluation,” IEEE Journal of Solid-State Circuits, in press.

Papers accepted: IEICE Transactions on Fundamentals

The following papers have benn accepted for publication by IEICE Transactions on Fundamentals. These works were carried out at Osaka University with Nagoya University and Socionext Inc.
T. Cheng, Y. Masuda, J. Nagayama, Y. Momiyama, J. Chen, and M. Hashimoto, “Activation-Aware Slack Assignment Based Mode-Wise Voltage Scaling for Energy Minimization,” IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, in press.

Y. Masuda, J. Nagayama, T. Cheng, T. Ishihara, Y. Momiyama, and M. Hashimoto, “Low-Power Design Methodology of Voltage Over-Scalable Circuit with Critical Path Isolation and Bit-Width Scaling,” IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, in press.

Paper accepted: IEEE Transactions on Information Forensics and Security

The following paper has been accepted for publication in IEEE Transactions on Information Forensics and Security (TIFS).
This work is a joint research with Nanjing University of Aeronautics and Astronautics.

Song Bian, Dur E Shahwar Kundi, Kazuma Hirozawa, Weiqiang Liu, and Takashi Sato, “APAS: Application-specific accelerators for RLWE-based homomorphic linear transformations,” IEEE Transactions on Information Forensics and Security (TIFS), accepted for publication.

Paper accepted: IEEE Transactions on Nuclear Science

The paper below has been accepted by IEEE Transactions on Nuclear Science (TNS). The first author is Mr. Ito who graduated from Osaka University in March 2021. This paper presents the result of the joint research project with Hitachi Ltd.

K. Ito, Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto, “Analyzing DUE Errors on GPUs with Neutron Irradiation Test and Fault Injection to Control Flow,” IEEE Transactions on Nuclear Science, in Early Access.

Press Release (Socionext and Partners Clarify Differences between Semiconductor Soft Errors Caused by Cosmic-Ray Muons and Neutrons)

Socionext Inc., High Energy Accelerator Research Organization, Kyoto University, and Osaka University issued a press release regarding the joint project performed with Socionext Inc at Osaka University (July 16th, 2021).

https://www.socionext.com/en/pr/sn_pr20210716_01e.pdf

https://www.kek.jp/en/press-en/20210715/

https://www.kyoto-u.ac.jp/en/research-news/2021-07-19

https://resou.osaka-u.ac.jp/ja/research/2021/20210716_2

The paper below is the base publication for this press release.

T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake, “Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles,” IEEE Transactions on Nuclear Science, 68(7), pp. 1436-1444, July 2021.