The following papers have been accepted for publication in IEEE Transactions on Nuclear Science.
Yuibi Gomi, Kazusa Takami, Rurie Mizuno, Megumi Niikura, Ryuichi Yasuda, Yifan Deng, Shoichiro Kawase, Yukinobu Watanabe, Shin-ichiro Abe, Wang Liao, Motonobu Tampo, Soshi Takeshita, Koichiro Shimomura, Yasuhiro Miyake and Masanori Hashimoto, “Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files,” in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2025.3542468.
Kazusa Takami, Yuibi Gomi, Ryuichi Yasuda, Shin-ichiro Abe, Masatoshi Itoh, Hiroki Kanda, Mitsuhiro Fukuda and Masanori Hashimoto, “Validating Terrestrial SER in 12-, 28- and 65-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation,” in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2025.3534564.
