A new website for Sato and Hashimoto Laboratory has opened. The previous website for Sato Laboratory is found at https://www.pass.cce.i.kyoto-u.ac.jp/ .
Paper accepted: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
The following paper has been accepted for publication in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD). This paper is a summary of the research results developed by a former student of our laboratory, who further extended the results of his research when he was a master’s course student.
- Shumpei Morita, Song Bian, Michihiro Shintani, and Takashi Sato, “Efficient analysis and mitigation of workload-dependent aging degradation,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), doi:10.1109/TCAD.2022.3149856 (early access)
Paper Accepted for ACM IUI 2022
The paper below has been accepted for 27th Annual Conference on Intelligent User Interfaces, Demos (ACM IUI, Demos).
R. Shirai and M. Hashimoto, “Shape-Flexible Underwater Display System with Wirelessly Powered and Controlled Smart LEDs,” in Proc. 27th International Conference on Intelligent User Interfaces (IUI’ 22 Companion), to appear.
This research has been executed in response to support of KIOXIA Corporation.
Journal paper accepted for JJAP
The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This is a joint work with Rohm Co. Ltd.
- Yasuhiro Ogasahara, Kazunori Kuribara, Kunihiro Ohshima, Zhaoxing Qin, and Takashi Sato, “Yield and Leakage Current of Organic Thin-Film Transistor Logic Gates toward Reliable and Low-Power Operation of Large-Scale Logic Circuits for IoT Nodes,” Japanese Journal of Applied Physics (JJAP), Vol.61, December 2021. doi:10.35848/1347-4065/ac44cf
Paper accepted for presentation in CCNC2022
The following paper has been accepted for presentation in CCNC2022 (IEEE Consumer Communications & Networking Conference 2022). This is a joint work with the research group of Prof. Koji Yamamoto (Kyoto Univ.).
- Takamochi Kanda, Takashi Sato, Hiromitsu Awano, Sota Kondo, and Koji Yamamoto, “Respiratory rate estimation based on WiFi frame capture,” in Proc. IEEE consumer communications & networking conference (CCNC), pp.1-4, January 2022.
Journal paper accepted for JJAP
The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This is an outcome of the joint work with National Institute of Advanced Industrial Science.
- Yasuhiro Ogasahara, Kazunori Kuribara, Kunihiro Ohshima, Zhaoxing Qin, and Takashi Sato, “Yield and Leakage Current of Organic Thin-Film Transistor Logic Gates toward Reliable and Low-Power Operation of Large-Scale Logic Circuits for IoT Nodes,” Japanese Journal of Applied Physics (JJAP), Vol.61, December 2021. doi:10.35848/1347-4065/ac44cf
(日本語) 電子情報通信学会 学生・若手研究会
Sorry, this entry is only available in 日本語.
Paper accepted for presentation in IRPS2022
The following paper has been accepted for presentation in IRPS2022 (IEEE International Reliability Physics Symposium 2022)．
- Masato Shiozaki and Takashi Sato, “Characteristic degradation of power MOSFETs by X-ray irradiation and its recovery,” in Proc. IEEE International Reliability Physics Symposium (IRPS), April 2022. (accepted for presentation)
SIGGRAPH Asia 2021
Assistant prof. Shirai gave a poster presentation at SIGGRAPH Asia 2021 held in Hybrid (Online + On-site (Tokyo, Japan)) from Dec. 14 to 17, 2021 (Presentation date: 16-17th.)
R. Shirai and M. Hashimoto, “Submarine LED: Wirelessly powered underwater display controlling its buoyancy,” SIGGRAPH Asia 2021 Posters, Article no. 6, Dec. 2021.
Accepted for publication in IEEE Transactions on Nuclear Science
The research results of the joint research with Kochi University of Technology conducted within the framework of OPERA will be published in IEEE Transactions on Nuclear Science.
T. Tanaka, W. Liao, M. Hashimoto, and Y. Mitsuyama, “Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: from Bit Upset to SEFI and Erroneous Behavior,” IEEE Transactions on Nuclear Science, accepted for publication.