Publication

Paper accepted: IEEE Access

by users

The following paper is accepted by IEEE Access. This is a collaborative work with Tokyo Institute of Technology.

Á. L. García-Arias, Y. Okoshi, M. Hashimoto, M. Motomura and J. Yu, “Recurrent Residual Networks Contain Stronger Lottery Tickets,” in IEEE Access, doi: 10.1109/ACCESS.2023.3245808.

Publication

Paper Accepted for JJAP

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The following papers have been accepted for publication in Japanese Journal of Applied Physics (JJAP). This is an outcome of the joint work with National Institute of Advanced Industrial Science.

  • Yasuhiro Ogasahara, Kazunori Kuribara, and Takashi Sato, “Measurement of 64 organic thin-film transistors in an array test structure using relay-switch board for efficient evaluation of long-term reliability,” Japanese Journal of Applied Physics (JJAP), accepted for publication. doi: 10.35848/1347-4065/acae2d
  • Yuto Kaneiwa, Kazunori Kuribara, and Takashi Sato, “Aging-robust amplifier composed of p-type low voltage OTFT and organic semiconductor load,” Japanese Journal of Applied Physics (JJAP), accepted for publication. doi: 10.35848/1347-4065/acb2be
Publication

Paper accepted: IEEE Transactions on Circuits and Systems II

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The following paper is accepted by IEEE Transactions on Circuits and Systems II. This is a collaborative work with Southern University of Science and Technology.

Q. Cheng, L. Dai, M. Huang, A. Shen, W. Mao, M. Hashimoto, H. Yu, “A Low-Power Sparse Convolutional Neural Network Accelerator with Pre-Encoding Radix-4 Booth Multiplier,” in IEEE Transactions on Circuits and Systems II: Express Briefs, doi: 10.1109/TCSII.2022.3231361.

Conference / Workshop

IRPS 2023

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The following paper has been accepted. It is the result of joint research with JAEA, the University of Tokyo, and AIST, and will be presented in Monterey, CA in March 2023.

K. Takami, Y. Gomi, S. Abe, W. Liao, S. Manabe, T. Matsumoto, and M. Hashimoto, “Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons,” Proceedings of International Reliability Physics Symposium (IRPS), to appear.

Publication

IEICE Trans. Fundamentals Paper Accepted

by users

The paper below has been accepted for publication.

Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto, “Vulnerability Estimation of DNN Model Parameters with Few Fault Injections,” IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, early access.
DOI:10.1587/transfun.2022VLP0004