The following paper has been accepted for publication in IEEE Journal of Solid-State Circuits.
- Kunyang Liu, Zihan Fu, Gen Li, Hongliang Pu, Zhibo Guan, Xingyu Wang, Shufan Xu, Kiichi Niitsu, and Hirofumi Shinohara, “A Physically Unclonable Function With Less Than 4.16E–7 BER Featuring Secure In-Cell HCI Burn-In and nMOS-Dominant PUF Data Generation,” IEEE Journal of Solid-State Circuits, doi: 10.1109/JSSC.2026.3663657.
