Conference / Workshop

DAC2024

by users

The following two talks were given at the ACM/IEEE Design Automation Conference (DAC) 2024, a top conference on integrated circuit design, held in San Francisco, USA, July 23-27, 2024 (presentation dates: July 25 (Koike) and 26 (Hashimoto)).

  • T. Koike, H. Awano, and T. Sato, “Triplet network-based DNA encoding for enhanced similarity image retrieval,” in Proc. ACM/IEEE Design Automation Conference (DAC), pp.1-6, July 2024.
  • Q. Cheng, Q. Li, L. Lin, W. Liao, L. Dai, H. Yu, and M. Hashimoto, “How accurately can soft error impact be estimated in black-box/white-box cases? — a case study with an edge AI SoC –,” in Proc. ACM/IEEE Design Automation Conference (DAC), pp.1-6, July 2024.
Conference / Workshop

HOST2024

by users

A research paper on PUF was presented at the IEEE International Symposium on Hardware Oriented Security and Trust (HOST) 2024 in Washington, DC, USA, May 6-9, 2024 (presentation date: May 9, 2024).

  • C. Zhenzhe, T. Sato, and H. Shinohara, “SpongePUF: A modeling attack resilient strong PUF with scalable challenge response pair,” in Proc. IEEE International Symposium on Hardware Oriented Security and Trust (HOST), pp.244-253, May 2024.
Conference / Workshop

Papers accepted at RADECS 2024

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The following papers have been accepted for the European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2024, scheduled to be held in Canary Islands, Spain, in September 2024:

Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, “Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), (accepted, to appear).
K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, “Validating Terrestrial SER in 12- and 28-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), (accepted, to appear).
K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, and H. Shindo, “Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), (accepted, to appear).

Conference / Workshop

DATE 2024

by users

M1 student Koike and faculty member Sato presented the following research at the Design, Automation and Test in Europe Conference (DATE) 2024 held in Valencia, Spain, on March 25-27, 2024 (presentation dates: March 25 and 27, respectively) Dr. Hashimoto served as a panelist at the Focus session “Resilience of Deep Learning Applications: Where We Are and Where We Want to Go” (March 27th).

  • Takefumi Koike, Hiromitsu Awano, and Takashi Sato, “DNA-based similar image retrieval via triplet network-driven encoder,” in Proc. Design, Automation and Test in Europe (DATE), pp.1-2, March 2024.
  • Sosei Ikeda, Hiromitsu Awano, and Takashi Sato, “Fast parameter optimization of delayed feedback reservoir with backpropagation and gradient descent,” in Proc. Design, Automation and Test in Europe (DATE), pp.1-6, March 2024.
Publication

Paper accepted: IEEE Transactions on Nuclear Science

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The following paper has been accepted for publication in the IEEE Transactions on Nuclear Science. This study is a collaborative research effort involving Kyushu University, National Institute of Advanced Industrial Science and Technology, Kochi University of Technology, Japan Atomic Energy Agency, and High Energy Accelerator Research Organization.

Y. Deng, Y. Watanabe, S. Manabe, W. Liao, M. Hashimoto, S. Abe, M. Tampo, and Y. Miyake, “Impact of Irradiation Side on Muon-Induced Single Event Upsets in 65-nm Bulk SRAMs,” in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2024.3378216 in press.

Award

SASIMI 2024 Outstanding Paper Award

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Two papers were presented at SASIMI2024, held in Taipei, Taiwan, on March 10-11, 2024, and Koike-kun’s paper received the Outstanding Paper Award.

  • Takefumi Koike and Takashi Sato, “Enhancing visual similarities in DNA-based similar image retrieval,” in Proc. Workshop on synthesis and system integration of mixed information technologies (SASIMI), pp.87-92, March 2024.
Award

IEICE VLD Excellent Student Author Award for ASP-DAC 2024

by users

Oshima-kun and Suemitsu-kun received the IEICE VLD Excellent Student Author Award for ASP-DAC 2024 at the IEICE VLD meeting held between February 28 and March 2, 2024. They also delivered memorial lectures at the meeting.

  • “Design of Aging-Robust Clonable PUF Using an Insulator-Based ReRAM for Organic Circuits,” Kunihiro Oshima, Kazunori Kuribara, Takashi Sato, IEICE Tech. Rep., vol. 123, no. 390, VLD2023-116, pp. 98-98, Feb. 2024.
  • “Logic Locking over TFHE for Securing User Data and Algorithms,” Kohei Suemitsu, Kotaro Matsuoka, Takashi Sato, and Masanori Hashimoto, IEICE Tech. Rep., vol. 123, no. 390, VLD2023-118, pp. 100-100, Feb. 2024.
Conference / Workshop

(日本語) ICMTS2024採録決定

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The following paper has been accepted for presentation at the IEEE International Conference on Microelectronic Test Structures (ICMTS), to be held in Edinburgh, Scotland, UK, in April 2024. This work is the result of joint research with Kyoto Institute of Technology.

  • Michihiro Shintani, Tetsuro Iwasaki, and Takashi Sato, “Gaussian process-based device model toward a unified current model across room to cryogenic temperatures,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), April 2024. (to appear)