Press Release (Socionext and Partners Clarify Differences between Semiconductor Soft Errors Caused by Cosmic-Ray Muons and Neutrons)

Socionext Inc., High Energy Accelerator Research Organization, Kyoto University, and Osaka University issued a press release regarding the joint project performed with Socionext Inc at Osaka University (July 16th, 2021).

https://www.socionext.com/en/pr/sn_pr20210716_01e.pdf

https://www.kek.jp/en/press-en/20210715/

https://www.kyoto-u.ac.jp/en/research-news/2021-07-19

https://resou.osaka-u.ac.jp/ja/research/2021/20210716_2

The paper below is the base publication for this press release.

T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake, “Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles,” IEEE Transactions on Nuclear Science, 68(7), pp. 1436-1444, July 2021.

Paper accepted for oral presentation at RADECS 2021

The paper below has been accepted for oral presentation at European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2021. This work is joint work with Prof. Jing-Jia Lou at National Tsing Hua University, Taiwan.

T. Hsu, D. Yang, W. Liao, M. Itoh, M. Hashimoto, and J. Liou, “Processor SER Estimation with ACE Bit Analysis,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), to appear.

Paper published: IEEE Transactions on Nuclear Science

Two papers below are published in IEEE Transactions on Nuclear Science. The first paper of Dr. Kato is attributed to the joint work with Socionext Inc. and the JST OPERA project. The second paper of Dr. Liao is attributed to the projects of JST OPERA, JSPS Kakenhi Kiban(S), and the joint work with Socionext Inc.

T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake, “Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles,” IEEE Transactions on Nuclear Science, 68(7), pp. 1436-1444, July 2021.

W. Liao, K. Ito, S. Abe, Y. Mitsuyama, and M. Hashimoto, “Characterizing Energetic Dependence of Low-energy Neutron-induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65 nm Bulk SRAM,” IEEE Transactions on Nuclear Science, 68(6), pp. 1228-1234, June 2021.

Papre presented at ISCAS 2021

Former Ph.D. student, Dr. TaiYu Cheng at Osaka University, gave a presentation at IEEE International Symposium on Circuits and Systems 2021 held in Hybrid (Online + On-site (Daegu, Korea)) from May 23 to 26, 2021 (Presentation date: 26th).

T. Cheng and M. Hashimoto, “Minimizing Energy of Dnn Training with Adaptive Bit-Width and Voltage Scaling,” Proceedings of IEEE International Symposium on Circuits and Systems (ISCAS), May 2021.