Assistant Prof. Shirai gave an invited talk at the IEICE Society Conference held online on 9/6-9, 2022.
“Element Technologies Required to Make IoT Devices More Pervasive Toward Society 6.0”
Assistant Prof. Shirai gave an invited talk at the IEICE Society Conference held online on 9/6-9, 2022.
“Element Technologies Required to Make IoT Devices More Pervasive Toward Society 6.0”
Prof. Hashimoto gave a keynote talk at International Test Conference in Asia (ITC-Asia) held in Taipei, Taiwan on August 24 – 36, 2022. Unfortunately, the talk was given online on August 25.
“Toward Correct Understanding and Characterization of Cosmic Ray-induced Soft Errors”
Mr. Tanaka, a first-year master course student, gave a short presentation at IEEE MWSCAS 2022 held online from Aug. 7 to 10, 2022.
T. Tanaka, R. Shirai, and M. Hashimoto, “DC Magnetic Field-Based Analytical Localization Robust to Known Stationary Magnetic Object,” in Proceedings of 65th IEEE International Midwest Symposium on Circuits and Systems, 2022.
Hashimoto gave a presentation on August 10 on behalf of the alumni student.
M. Tanaka, J. Yu, M. Nakagawa, N. Tate, and M. Hashimoto, “Investigating Small Device Implementation of FRET-Based Optical Reservoir Computing,” Proceedings of International Midwest Symposium on Circuits and Systems (MWSCAS), August 2022.
The following paper has been accepted for the International Conference on Compilers, Architectures, and Synthesis for Embedded Systems (CASES) 2022 during Embedded Systems Week (ESWEEK), scheduled for October 7-14, 2022. (The paper will be presented at ESWEEK and published in TCAD).
Sosei Ikeda, Hiromitsu Awano, and Takashi Sato, “Hardware-friendly delayed feedback reservoir for multivariate time series classification,” IEEE Transactions on Computer-Aided Design of integrated circuits and systems (TCAD), doi: 10.1109/TCAD.2022.3197488.
The following paper has been accepted for presentation at the International Conference on Solid State Devices and Materials (SSDM) 2022. This work is the result of joint research with National Institute of Advanced Industrial Science and Technology (AIST).
Yuto Kaneiwa, Kazunori Kuribara, and Takashi Sato, “Aging-robust Amplifier Design Using Low Voltage Organic Semiconductor Loads,” in Proc. International Conference on Solid State Devices and Materials (SSDM), September 2022 (to appear).
The paper below is also accepted.
M. Hashimoto, Y. Zhang, and K. Ito, “Neutron-Induced Stuck Error Bits and Their Recovery in DRAMs on GPU Cards,” Proceedings of International Conference on Solid State Devices and Materials (SSDM), to appear.
Prof. Sato and M2 Matsuoka gave a tutorial talk at the Design Automation Conference (DAC) held in San Francisco, CA, USA, July 10-14, 2022, on “FHE Circuit Construction and Synthesis” at Design Automation Conference (DAC). (Tutorial was July 11)
Prof. Hashimoto gave an invited talk at the International Interconnect Technology Conference (IITC) held in San Jose, California on 6/27-30, 2022.
“Via-switch FPGA with Transistor-free Programmability”
The following papers have been accepted for presentation at European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2022.
K. Ito, H. Itsuji, T. Uezono, T. Toba, M. Itoh, and M. Hashimoto, “Constructing Application-Level GPU Error Rate Model with Neutron Irradiation Experiment,” European Conference on Radiation and Its Effects on Components and Systems (RADECS), to appear.
This is the result of research by Ito, a master’s degree graduate of Osaka University, in collaboration with Hitachi, Ltd. and Tohoku University.
S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, and Y. Watanabe, “A Terrestrial SER Estimation Methodology with Simulation and Single-Source Irradiation Applicable to Diverse Neutron Sources,” European Conference on Radiation and Its Effects on Components and Systems (RADECS), to appear.
This is a research result of the OPERA project, an industry-academia collaboration, and is a joint paper with Japan Atomic Energy Agency, the University of Tokyo, Socionext, HIREC, Hitachi, Ltd, Kyoto Institute of Technology, and Kyushu University.
M. Kamibayashi, K. Kobayashi, and M. Hashimoto, “Single Bit Upsets Versus Burst Errors of Stacked-Capacitor DRAMs Induced by High-Energy Neutron -SECDED Is No Longer Effective-,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), to appear.
This is the result of joint research with Kyoto Institute of Technology and will be presented at the Data Workshop.
The following paper has been accepted for presentation at the EPE 2022 ECCE Europe conference (EPE) 2022, an international conference related to power electronics to be held in September 2022.
This is the result of joint research with Nara Institute of Science and Technology (NAIST) and Kyoto Institute of Technology (KIT).