OBの田中君の論文が、2023 IEEE Biomedical Circuits and Systems Conferenceに採択されました。
Alumni Tanaka-Kun’s papers is accepted to 2023 IEEE Biomedical Circuits and Systems Conference !
Akiyoshi Tanaka, Guowei Chen, Kiichi Niitsu, “A 0.063-mm^2 1.75-nW Biofuel Cell-Input Biosensing/Data-Storing System with 5.5-GHz Wireless Backscatter Data-Readout in 65-nm CMOS for Self-Powered Smart Contact Lenses”
At the Design Automation Conference (DAC) held July 9-13, 2023 in San Francisco, California, USA, Ikeda (M2) gave a poster presentation in the WIP session.
S. Ikeda, H. Awano, and T. Sato, “No-NL DFR: New model of digital delayed feedback reservoir without nonlinear elements”
The following paper has been accepted for presentation at the International Conference on Solid State Devices and Materials (SSDM) 2022. This work is the result of joint research with National Institute of Advanced Industrial Science and Technology (AIST).
The following paper has been accepted for publication in ACM Transactions on Embedded Computing Systems (TECS). This research will be presented orally at the International Conference on Compilers, Architectures, and Synthesis for Embedded Systems (CASES), one of the international conferences comprising Embedded System Week (ESWeek), to be held in Hamburg, Germany, in September 2023.
Sosei Ikeda, Hiromitsu Awano, and Takashi Sato, “Modular DFR: Digital delayed feedback reservoir model for enhancing design flexibility,” ACM Transactions on Embedded Computing Systems (TECS), accepted for publication.
The following paper has been accepted for the International Test Conference (ITC 2023) to be held in Anaheim, USA, in October 2023. This work is the outcome of joint research with Sony Semiconductor Manufacturing, Kyoto Institute of Technology, and Nara Institute of Science and Technology.
Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Takashi Sato and Michihiro Shintani, “Improving efficiency and robustness of Gaussian process based outlier detection via ensemble learning,” in Proc. International Test Conference (ITS) 2023, to appear.
The following papers have been accepted for the European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2023, scheduled to be held in Toulouse, France, in September 2023:
Y. Gomi, K. Takami, R. Mizuno, M. Niikura, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, I. Umegaki, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, “Muon-Induced SEU Cross Sections of 12-nm FinFET and 28-nm Planar SRAMs,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), to appear.
M. Yoshida, R. Iwamoto, M. Itoh, and M. Hashimoto, “Stuck Errors in Bits and Blocks in GDDR6 under High-Energy Neutron Irradiation,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), to appear in Data workshop.
OBの陳国威君の論文が、IEEE International Symposium on Circuits and Systems 2023 (ISCAS 2023)に採択されました。
Alumni CHEN-Kun’s papers is accepted to IEEE International Symposium on Circuits and Systems 2023 !
Guowei Chen, Akiyoshi Tanaka, Kiichi Niitsu, “A Battery-Less 0.37 V 126 nW 0.29 mm2 65-nm CMOS Biofuel-Cell-Modulated Biosensing System Featuring an FSK-PIM-Combined 2.4 GHz Transmitter for Continuous Glucose Monitoring Contact Lenses”
The following paper has been accepted for IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) to be held in Chania (Crete), Greece, in July 2023.
R. Iwamoto and M. Hashimoto, “Avoiding Soft Error-Induced Illegal Memory Accesses in GPU with Inter-Thread Communication,” Proceedings of International Symposium on On-Line Testing and Robust System Design (IOLTS), to appear.
Sorry, this entry is only available in 日本語.
The following paper has been accepted for the IEEE International Conference on Flexible, Printable Sensors and Systems (FLEPS 2023) to be held in Boston, USA, in July 2023. This research results from joint research with the National Institute of Advanced Industrial Science and Technology (AIST).
Qin Zhaoxing, Kunihiro Oshima, Kazunori Kuribara, and Takashi Sato, “OPTL: Robust and area-efficient pass gate logic for organic transistors,” in Proc. IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS), to appear.