Author: users

Publication

Publication at IACR TCHES

by users

The following paper has been published at IACR TCHES. This paper is a collaborative work with Tohoku University, NTT Social Informatics Laboratories, and NEC. The paper will be presented at International Conference on Cryptographic Hardware and Embedded Systems (CHES) in September 2025.

Rei Ueno, Akira Ito, Yosuke Todo, Akiko Inoue, Kazuhiko Minematsu, Hibiki Ishikawa, and Naofumi Homma, “All You Need is XOR-Convolution: A Generalized Higher-Order Side-Channel Attack with Application to XEX/XE-based Encryptions,” IACR Transactions on Cryptographic Hardware and Embedded Systems, 2025(3), pp. 317-360, 2025. https://doi.org/10.46586/tches.v2025.i3.317-360

Publication

Paper Accepted for Publication in IEEE Transactions on Device and Materials Reliability

by users

The following paper has been accepted for publication in IEEE Transactions on Device and Materials Reliability.

Shufan Xu, Kunyang Liu, Kiichi Niitsu and Hirofumi Shinohara, “Statistical Model and Transistor Size Effect of Hot Carrier Injection for Stability Reinforced SRAM Physically Unclonable Function,” IEEE Transactions on Device and Materials Reliability, doi: 10.1109/TDMR.2025.3574796.

Publication

Paper Accepted for Publication in IEEE Transactions on Electron Devices

by users

The following paper has been accepted for publication in IEEE Transactions on Electron Devices. This research is the result of a collaborative study with Kyoto Institute of Technology.

  • M. Shintani, K. Oishi, Y. Nishitani, H. Takayama, and T. Sato, “Comprehensive MOSFET capacitance characterization based on charge trajectories,” IEEE Transactions on Electron Devices, Vol.72, No.7, doi: 10.1109/TED.2025.3572874
Conference / Workshop

Paper accepted to MWSCAS 2025

by users

M1 Awano-Kun’s International Conference paper is accepted to IEEE International Midwest Symposium on Circuits and Systems (MWSCAS), which will be held in Lansing, Michigan, USA, in August 2025.

Kei Awano, You Wu, Kento Okamura, Teruaki Ono, Kohei Sakamoto, Hiroaki Kitaike, Hironori Tagawa, Jin Nakamura, Masaya Kaneko, Yuta Kimura, Hiroaki Nakamura, Shufan Xu, Ruilin Zhang, Kunyang Liu, Hirofumi Shinohara, and Kiichi Niitsu, “A 110-mV 12-pW 0.00006-mm2 7-nm FinFET Self-Oscillating Voltage Doubler Using Vertically Implemented Back-End Metal-Oxide-Metal Capacitors For Small-Formfactor Up-Conversion”, to appear.

Conference / Workshop

Paper accepted to EUSIPCO 2025

by users

The following paper has been accepted to European Signal Processing Conference (EUSIPCO), which will be held in Palermo, Italy in September 2025.

C. Biesinger, H. Awano, and M. Hashimoto, “Window Function-Less DFT with Reduced Noise and Latency for Real-Time Music Analysis,” Proceedings of European Signal Processing Conference (EUSIPCO), to appear.

Conference / Workshop

Paper accepted to ISLPED 2025

by users

The following paper has been accepted to International Symposium on Low Power Electronics and Design (ISLPED), which will be held in Iceland in August 2025.

Q. Cheng, H. Zhang, Q. Li, Y. Liang, M. Zhang, Z. Chen, R. Zhang, J. Xiong, M. Huang, L. Lin, and M. Hashimoto, “A Scalable External Memory Access and On-Chip Storage Architecture for Edge-AI Accelerators — Multi-Path Rolling Data Refresh and Layer-Wise Bank Allocation –,” Proceedings of IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), to appear.

Conference / Workshop

Paper accepted to ITC 2025

by users

The following paper has been accepted to International Test Conference (ITC), which will be held in San Diego, California, USA in September 2025.

Q. Cheng, H. Chi, C. Liang, Y. Chao, H. Zhang, Y. Liang, M. Zhang, W. Liao, J. Xiong, J. Liou, M. Hashimoto, and L. Lin, “Genshin: a Generalized Framework with Software-Hardware Co-Design and Pruned Fault Injection for Reliability Analysis,” Proceedings of International Test Conference (ITC), to appear.

Publication

Papers accepted in IEEE Transactions on Nuclear Science

by users

The following paper has been accepted for publication in IEEE Transactions on Nuclear Science. This work is the research achievement of Dr. Takeuchi, who received his Ph.D. degree in September 2024.”

K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, H. Shindo, “Cross-section Prediction Method for Proton Direct Ionization Induced Single Event Upset,” in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2025.3568455.