We had a face-to-face meeting with the new members (April 3, 2023). Let’s have a good time!
IRPS 2023
Kazusa Takami gave a poster presentation at International Reliability Physics Symposium (IRPS) on March 29, held in Monterey CA, USA from March 26 to 30, 2023.
K. Takami, Y. Gomi, S. Abe, W. Liao, S. Manabe, T. Matsumoto, and M. Hashimoto, “Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons,” Proceedings of International Reliability Physics Symposium (IRPS), 2023.
ICMTS2023
Niiyama-kun (M1) presented his research at International Conference on Microelectronic Test Structures (ICMTS 2023) held at the University of Tokyo from March 27 to 30, 2023.
- K. Niiyama, H. Awano, and T. Sato, “Introducing transfer learning framework on device modeling by machine learning,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), pp.158-163, March 2023.
ACM IUI 2023
Harimaya gave a poster presentation at 28th Annual Conference on Intelligent User Interfaces (ACM IUI) held in Sydney, Australia on March 26–31, 2023.
M. Harimaya, R. Shirai, and M. Hashimoto, “Toward Instant 3D Modeling: Highly Parallelizable Shape Reproduction Method for Soft Object Containing Numerous Tiny Position Trackers,”in Companion Proceedings of the 28th International Conference on Intelligent User Interfaces (IUI), pp. 130–133, March 2022.
Paper accepted: IEEE Access
The following paper is accepted by IEEE Access. This is a collaborative work with Tokyo Institute of Technology.
Á. L. García-Arias, Y. Okoshi, M. Hashimoto, M. Motomura and J. Yu, “Recurrent Residual Networks Contain Stronger Lottery Tickets,” in IEEE Access, doi: 10.1109/ACCESS.2023.3245808.
(日本語) 3回生（研究室配属対象者）向け研究室説明会2023
Sorry, this entry is only available in 日本語.
(日本語) MICT研究会
Sorry, this entry is only available in 日本語.
Paper Accepted for JJAP
The following papers have been accepted for publication in Japanese Journal of Applied Physics (JJAP). This is an outcome of the joint work with National Institute of Advanced Industrial Science.
- Yasuhiro Ogasahara, Kazunori Kuribara, and Takashi Sato, “Measurement of 64 organic thin-film transistors in an array test structure using relay-switch board for efficient evaluation of long-term reliability,” Japanese Journal of Applied Physics (JJAP), accepted for publication. doi: 10.35848/1347-4065/acae2d
- Yuto Kaneiwa, Kazunori Kuribara, and Takashi Sato, “Aging-robust amplifier composed of p-type low voltage OTFT and organic semiconductor load,” Japanese Journal of Applied Physics (JJAP), accepted for publication. doi: 10.35848/1347-4065/acb2be
Paper accepted: IEEE Transactions on Circuits and Systems II
The following paper is accepted by IEEE Transactions on Circuits and Systems II. This is a collaborative work with Southern University of Science and Technology.
Q. Cheng, L. Dai, M. Huang, A. Shen, W. Mao, M. Hashimoto, H. Yu, “A Low-Power Sparse Convolutional Neural Network Accelerator with Pre-Encoding Radix-4 Booth Multiplier,” in IEEE Transactions on Circuits and Systems II: Express Briefs, doi: 10.1109/TCSII.2022.3231361.