Press Release (Socionext and Partners Clarify Differences between Semiconductor Soft Errors Caused by Cosmic-Ray Muons and Neutrons)

Socionext Inc., High Energy Accelerator Research Organization, Kyoto University, and Osaka University issued a press release regarding the joint project performed with Socionext Inc at Osaka University (July 16th, 2021).

https://www.socionext.com/en/pr/sn_pr20210716_01e.pdf

https://www.kek.jp/en/press-en/20210715/

https://www.kyoto-u.ac.jp/en/research-news/2021-07-19

https://resou.osaka-u.ac.jp/ja/research/2021/20210716_2

The paper below is the base publication for this press release.

T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake, “Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles,” IEEE Transactions on Nuclear Science, 68(7), pp. 1436-1444, July 2021.