Press Release (Socionext and Partners Clarify Differences between Semiconductor Soft Errors Caused by Cosmic-Ray Muons and Neutrons)

Socionext Inc., High Energy Accelerator Research Organization, Kyoto University, and Osaka University issued a press release regarding the joint project performed with Socionext Inc at Osaka University (July 16th, 2021).

The paper below is the base publication for this press release.

T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake, “Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles,” IEEE Transactions on Nuclear Science, 68(7), pp. 1436-1444, July 2021.