Author: users

Conference / Workshop

Papers accepted at RADECS 2024

by users

The following papers have been accepted for the European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2024, scheduled to be held in Canary Islands, Spain, in September 2024:

Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, “Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), (accepted, to appear).
K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, “Validating Terrestrial SER in 12- and 28-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), (accepted, to appear).
K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, and H. Shindo, “Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset,” Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), (accepted, to appear).

Publication

IEEE TCAS-I 採録決定

by users

張特定助教の原著論文がIEEE Transactions on Circuits and Systems I (TCAS-I)に採択されました。

Project.Zhang’s Jounal paper is accepted to IEEE Transactions on Circuits and Systems I (TCAS-I) !

Ruilin Zhang, Haochen Zhang, Xingyu Wang, Ye Ziyang, Kunyang Liu, Shinichi Nishizawa, Kiichi Niitsu and Hirofumi Shinohara, “De-correlation and De-bias Post-processing Circuits for True Random Number Generator”

Conference / Workshop

DATE 2024

by users

M1 student Koike and faculty member Sato presented the following research at the Design, Automation and Test in Europe Conference (DATE) 2024 held in Valencia, Spain, on March 25-27, 2024 (presentation dates: March 25 and 27, respectively) Dr. Hashimoto served as a panelist at the Focus session “Resilience of Deep Learning Applications: Where We Are and Where We Want to Go” (March 27th).

  • Takefumi Koike, Hiromitsu Awano, and Takashi Sato, “DNA-based similar image retrieval via triplet network-driven encoder,” in Proc. Design, Automation and Test in Europe (DATE), pp.1-2, March 2024.
  • Sosei Ikeda, Hiromitsu Awano, and Takashi Sato, “Fast parameter optimization of delayed feedback reservoir with backpropagation and gradient descent,” in Proc. Design, Automation and Test in Europe (DATE), pp.1-6, March 2024.
Conference / Workshop

VLSI 2024 採録決定

by users

M1の北池君の国際会議発表論文がIEEE Symposium on VLSI Technology and Circuits (VLSI) に採択されました。

M1 Kitaike-Kun’s　International Conference paper is accepted to IEEE Symposium on VLSI Technology and Circuits (VLSI) !

Hiroaki Kitaike, Masaharu Inada, Mitsuru Terauchi, Hironori Tagawa, Ryosuke Nagai, Shufan Xu, Ruilin Zhang, Kunyang Liu, and Kiichi Niitsu,
“A 0.9-2.6pW 0.1-0.25V 22nm 2-bit Supply-to-Digital Converter Using Always-Activated Supply-Controlled Oscillator and Supply-Dependent-Activation Buffers for Bio-Fuel-Cell-Powered-and-Sensed Time-Stamped Bio-Recording”

Publication

Paper accepted: IEEE Transactions on Nuclear Science

by users

The following paper has been accepted for publication in the IEEE Transactions on Nuclear Science. This study is a collaborative research effort involving Kyushu University, National Institute of Advanced Industrial Science and Technology, Kochi University of Technology, Japan Atomic Energy Agency, and High Energy Accelerator Research Organization.

Y. Deng, Y. Watanabe, S. Manabe, W. Liao, M. Hashimoto, S. Abe, M. Tampo, and Y. Miyake, “Impact of Irradiation Side on Muon-Induced Single Event Upsets in 65-nm Bulk SRAMs,” in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2024.3378216 in press.

Award

SASIMI 2024 Outstanding Paper Award

by users

Two papers were presented at SASIMI2024, held in Taipei, Taiwan, on March 10-11, 2024, and Koike-kun’s paper received the Outstanding Paper Award.

  • Takefumi Koike and Takashi Sato, “Enhancing visual similarities in DNA-based similar image retrieval,” in Proc. Workshop on synthesis and system integration of mixed information technologies (SASIMI), pp.87-92, March 2024.
Award

IEICE VLD Excellent Student Author Award for ASP-DAC 2024

by users

Oshima-kun and Suemitsu-kun received the IEICE VLD Excellent Student Author Award for ASP-DAC 2024 at the IEICE VLD meeting held between February 28 and March 2, 2024. They also delivered memorial lectures at the meeting.

  • “Design of Aging-Robust Clonable PUF Using an Insulator-Based ReRAM for Organic Circuits,” Kunihiro Oshima, Kazunori Kuribara, Takashi Sato, IEICE Tech. Rep., vol. 123, no. 390, VLD2023-116, pp. 98-98, Feb. 2024.
  • “Logic Locking over TFHE for Securing User Data and Algorithms,” Kohei Suemitsu, Kotaro Matsuoka, Takashi Sato, and Masanori Hashimoto, IEICE Tech. Rep., vol. 123, no. 390, VLD2023-118, pp. 100-100, Feb. 2024.
Conference / Workshop

(日本語) ICMTS2024採録決定

by users

The following paper has been accepted for presentation at the IEEE International Conference on Microelectronic Test Structures (ICMTS), to be held in Edinburgh, Scotland, UK, in April 2024. This work is the result of joint research with Kyoto Institute of Technology.

  • Michihiro Shintani, Tetsuro Iwasaki, and Takashi Sato, “Gaussian process-based device model toward a unified current model across room to cryogenic temperatures,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), April 2024. (to appear)