Niiyama-kun (M1) presented his research at International Conference on Microelectronic Test Structures (ICMTS 2023) held at the University of Tokyo from March 27 to 30, 2023.
- K. Niiyama, H. Awano, and T. Sato, “Introducing transfer learning framework on device modeling by machine learning,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), pp.158-163, March 2023.
