The following paper has been accepted for publication in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD). This paper is a summary of the research results developed by a former student of our laboratory, who further extended the results of his research when he was a master’s course student.
- Shumpei Morita, Song Bian, Michihiro Shintani, and Takashi Sato, “Efficient analysis and mitigation of workload-dependent aging degradation,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), doi:10.1109/TCAD.2022.3149856 (early access)
