The following paper has been accepted. It is the result of joint research with JAEA, the University of Tokyo, and AIST, and will be presented in Monterey, CA in March 2023.
K. Takami, Y. Gomi, S. Abe, W. Liao, S. Manabe, T. Matsumoto, and M. Hashimoto, “Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons,” Proceedings of International Reliability Physics Symposium (IRPS), to appear.
