Journal paper accepted for JJAP

The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This is an outcome of the joint work with National Institute of Advanced Industrial Science.

  • Yasuhiro Ogasahara, Kazunori Kuribara, Kunihiro Ohshima, Zhaoxing Qin, and Takashi Sato, “Yield and Leakage Current of Organic Thin-Film Transistor Logic Gates toward Reliable and Low-Power Operation of Large-Scale Logic Circuits for IoT Nodes,” Japanese Journal of Applied Physics (JJAP), Vol.61, December 2021. doi:10.35848/1347-4065/ac44cf