The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This is a joint work with Rohm Co. Ltd.
- Yasuhiro Ogasahara, Kazunori Kuribara, Kunihiro Ohshima, Zhaoxing Qin, and Takashi Sato, “Yield and Leakage Current of Organic Thin-Film Transistor Logic Gates toward Reliable and Low-Power Operation of Large-Scale Logic Circuits for IoT Nodes,” Japanese Journal of Applied Physics (JJAP), Vol.61, December 2021. doi:10.35848/1347-4065/ac44cf
