The following paper has been accepted for the International Test Conference (ITC 2023) to be held in Anaheim, USA, in October 2023. This work is the outcome of joint research with Sony Semiconductor Manufacturing, Kyoto Institute of Technology, and Nara Institute of Science and Technology.
Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Takashi Sato and Michihiro Shintani, “Improving efficiency and robustness of Gaussian process based outlier detection via ensemble learning,” in Proc. International Test Conference (ITS) 2023, to appear.
