The following paper has been accepted for publication in IEEE Transactions on Nuclear Science.
Y. Gomi, K. Takami, R. Yasuda, H. Kanda, M. Fukuda and M. Hashimoto, “Quasi Event-Wise Measurement and Simulation of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs,” in IEEE Transactions on Nuclear Science, doi: 10.1109/TNS.2026.3675003.
