ITC 2025

Prof. Hashimoto presented the following paper at the IEEE International Test Conference (ITC 2025), held in San Diego, USA, from September 21 to 26, 2025 (presentation date: September 23).

Q. Cheng, H. Chi, C. Liang, Y. Chao, H. Zhang, Y. Liang, M. Zhang, W. Liao, J. Xiong, J. Liou, M. Hashimoto, and L. Lin, “Genshin: a Generalized Framework with Software-Hardware Co-Design and Pruned Fault Injection for Reliability Analysis,” Proceedings of International Test Conference (ITC), 2025.