集積システム工学講座 / Integrated Systems Engineering Laboratory

The following paper has been accepted for presentation at the IEEE International Conference on Microelectronic Test Structures (ICMTS) 2026,
which will be held in Matsue, Japan, from March 23 to 26, 2026.

• Ryuto Seki, Masami Utsunomiya, Yu-Guang Chen, Hiromitsu Awano, and Takashi Sato, “Improving Robustness of Leakage-Based MOSFET Reservoir Computing Using Adaptive Pulse-Width Control”, IEEE International Conference on Microelectronic Test Structures (ICMTS) 2026 (accepted).

The following paper has been accepted to CICC (IEEE Custom Integrated Circuits Conference) 2026. We will present the results in April 2026.

• Z. Chen, K. Liu, W. Dong, Q. Cheng, J. Li, L. Lin, and T. Sato, “An 83-F^2 2T PUF featuring isolated hot-carrier injection and lightweight majority-voting-based strong PUF mode,” in Proc. IEEE Custom Integrated Circuits Conference (CICC), April 2026 (accepted).

The following paper has been accepted for IRPS 2026. It will be presented in Tucson, Arizona, in March 2026.

Yuibi Gomi, Kazusa Takami, Koyo Morita, and Masanori Hashimoto, “Proton-Induced Distant MCU Analysis with Quasi Event-Wise Dynamic Measurement in 22-nm and 55-nm SRAMs,” Proceedings of International Reliability Physics Symposium (IRPS), to appear.

Sorry, this entry is only available in 日本語.

The following papers have been accepted for ISSCC 2026.
We will present our results in San Francisco in February 2026.

S. Xu*, K. Liu*, L. Chan, H. Tagawa, H. Shinohara, K. Niitsu, “A Sub-Threshold All-nMOS Reconfigurable PUF with Secure Configuration Selection for Stable 6-Bits/Cell,” Technical Digest of International Solid-State Circuits Conference (ISSCC), to appear. (*ECAs)

Q. Cheng*, Z. Yang*, H. Li, Q. Li, Z. Kong, G. Niu, Y. Liang, J. Li, J. Yoo, M. Hashimoto, and L. Lin, “A Radiation-Hardened Self-Healing Cmos Imager with Online Pixel/Logic Annealing and Tile-Adaptive Compression for Space Applications,” Technical Digest of International Solid-State Circuits Conference (ISSCC), to appear. (*ECAs)

The following papers have been accepted for DATE 2026.
We will present our results in Verona, Italy, in April 2026.

• Quan Cheng, Haoyuan Li, Wang Liao, Feng Liang, Longyang Lin, Masanori Hashimoto, “Gohan: A Golden-Copy-Aided Platform Enabling Online Hybrid-Interactive Reliability Analysis,” Proc. DATE, to appear.
• Quan Cheng, Haoyuan Li, Zhenzhe Chen, Wang Liao, Jing-jia Liou, Masanori Hashimoto, Longyang Lin, “Ramen: Radiation-Aware Modeling Framework for PDK-Enabled Design and Library Characterization,” Proc. DATE, to appear.

At the IEEE Asian Solid-State Circuits Conference (IEEE A-SSCC 2025) held in Daejeon, South Korea, from November 2 to 5, 2025, Ms. Xu (D3) presented the following paper (presentation took place on November 3).

• Shufan Xu*, Kunyang Liu*, Nan Wang, Hirofumi Shinohara and Kiichi Niitsu, “A Less than 6.5E−8 BER 36-Way Reconfigurable PUF with 4-bit Stable Responses per Cell Featuring Machine Learning-Based Best-Configuration Selection,” in Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), Daejeon, South Korea, Nov. 2025, pp.103-105. (*Equally Credited Authors)

At International Conference on Computer-Aided Design (ICCAD 2025), held in Munich, Germany from October 26 to October 31, 2025, Hashimoto and Guo gave presentations on the following papers (presentation dates: October 27 and October 28, respectively).

• Quan Cheng, Huizi Zhang, Chien-Hsing Liang, Mingtao Zhang, Jing-Jia Liou, Jinjun Xiong, Longyang Lin and Masanori Hashimoto, “Tenpura: a General Transient Fault Evaluation and Scope Narrowing Platform for Ultra-Fast Reliability Analysis,” in Proceedings of International Conference on Computer-Aided Design (ICCAD), pp.1-6, Oct. 2025.
• Xinyi Guo, Geguang Miao, Shinichi Nishizawa, Hiromitsu Awano, Shinji Kimura, and Takashi Sato, “SOME: Symmetric One-Hot Matching Elector — A Lightweight Microsecond Decoder for Quantum Error Correction,” in Proceedings of International Conference on Computer-Aided Design (ICCAD), pp.1-6, Oct. 2025.