集積システム工学講座 / Integrated Systems Engineering Laboratory

The following papers have been accepted for ISSCC 2026.
We will present our results in San Francisco in Feburary 2026.

S. Xu, K. Liu, L. Chan, H. Tagawa, H. Shinohara, K. Niitsu, “A Sub-Threshold All-nMOS Reconfigurable PUF with Secure Configuration Selection for Stable 6-Bits/Cell,” Technical Digest of International Solid-State Circuits Conference (ISSCC), to appear.

Q. Cheng, Z. Yang, H. Li, Q. Li, Z. Kong, G. Niu, Y. Liang, J. Li, J. Yoo, M. Hashimoto, and L. Lin, “A Radiation-Hardened Self-Healing Cmos Imager with Online Pixel/Logic Annealing and Tile-Adaptive Compression for Space Applications,” Technical Digest of International Solid-State Circuits Conference (ISSCC), to appear.

The following papers have been accepted for DATE 2026.
We will present our results in Verona, Italy, in April 2026.

• Quan Cheng, Haoyuan Li, Wang Liao, Feng Liang, Longyang Lin, Masanori Hashimoto, “Gohan: A Golden-Copy-Aided Platform Enabling Online Hybrid-Interactive Reliability Analysis,” Proc. DATE, to appear.
• Quan Cheng, Haoyuan Li, Zhenzhe Chen, Wang Liao, Jing-jia Liou, Masanori Hashimoto, Longyang Lin, “Ramen: Radiation-Aware Modeling Framework for PDK-Enabled Design and Library Characterization,” Proc. DATE, to appear.

At the IEEE Asian Solid-State Circuits Conference (IEEE A-SSCC 2025) held in Daejeon, South Korea, from November 2 to 5, 2025, Ms. Xu (D3) presented the following paper (presentation took place on November 3).

• Shufan Xu*, Kunyang Liu*, Nan Wang, Hirofumi Shinohara and Kiichi Niitsu, “A Less than 6.5E−8 BER 36-Way Reconfigurable PUF with 4-bit Stable Responses per Cell Featuring Machine Learning-Based Best-Configuration Selection,” in Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), Daejeon, South Korea, Nov. 2025, pp.103-105. (*Equally Credited Authors)

At International Conference on Computer-Aided Design (ICCAD 2025), held in Munich, Germany from October 26 to October 31, 2025, Hashimoto and Guo gave presentations on the following papers (presentation dates: October 27 and October 28, respectively).

• Quan Cheng, Huizi Zhang, Chien-Hsing Liang, Mingtao Zhang, Jing-Jia Liou, Jinjun Xiong, Longyang Lin and Masanori Hashimoto, “Tenpura: a General Transient Fault Evaluation and Scope Narrowing Platform for Ultra-Fast Reliability Analysis,” in Proceedings of International Conference on Computer-Aided Design (ICCAD), pp.1-6, Oct. 2025.
• Xinyi Guo, Geguang Miao, Shinichi Nishizawa, Hiromitsu Awano, Shinji Kimura, and Takashi Sato, “SOME: Symmetric One-Hot Matching Elector — A Lightweight Microsecond Decoder for Quantum Error Correction,” in Proceedings of International Conference on Computer-Aided Design (ICCAD), pp.1-6, Oct. 2025.

At the IEEE SENSORS 2025 held in Vancouver, Canada, from October 19 to 22, 2025,
Mr. Sadamu (M2) and Prof. Shirai presented the following papers (both presentations took place on October 20).

• R. Sada, T. Tanaka, H. Asaue, T. Shiotani, M. Hashimoto, and R. Shirai, “Localization of Embedded Sensors in Reinforced Concrete Via Time-Series Magnetic Field Sensing and Maximum Likelihood Estimation,” IEEE Sensors Letters, to appear.
• R. Fukugasako, H. Asaue, T. Shiotani, M. Hashimoto, and R. Shirai, “A Current Chopper-Assisted Magnetic Field-Based Backscatter Communication Method with WPT Overcoming Ultra-Low Coupling Coefficients,” IEEE Sensors Journal, volume 25, number 10, pages 18249-18256, May 2025.

At the 26th Workshop on Synthesis and System Integration of Mixed Information Technologies (SASIMI2025), which was held from October 9 to 10 in Nara City, the following presentations were given (Li, Seki presented on October 9, Utsunomiya presented on October 10).

• Ryuto Seki, Masami Utsunomiya, Haoyuan Li, Hiromitsu Awano, and Takashi Sato, “LMESN: A low-power hardware reservoir computing architecture based on MOSFET leakage variation,” in Proc. Workshop on synthesis and system integration of mixed information technologies (SASIMI), pp.115-120, October 2025.
• Masami Utsunomiya, Hiroya Murata, Ryuto Seki, Haoyuan Li, Hiromitsu Awano, and Takashi Sato, “Accelerated behavioral simulation for optimizing MOSFET-based echo state networks,” in Proc. Workshop on synthesis and system integration of mixed information technologies (SASIMI), pp.290-295, October 2025.
• Haoyuan Li, Masami Utsunomiya, Ryuto Seki, Takashi Sato, and Feng Liang, “EMESN: An extended MOSFET reservoir computing architecture for echo state networks with hardware-software co-optimization,” in Proc. Workshop on synthesis and system integration of mixed information technologies (SASIMI), pp.103-108, October 2025.

Our paper has been accepted for presentation in the Posters session at SIGGRAPH ASIA 2025. We will present our results in Hong Kong this December.
This work is the result of a collaborative research project with Mr. Takahashi and Mr. Sawada from Rakusei High School.

Chiaki Takahashi*, Hayato Sawada*, Ryo Shirai*, Masanori Hashimoto, “High-Clarity Underwater 3D Display Enabled by Electrolysis-Free Water-Mediated Wireless Power Transmission,” SIGGRAPH ASIA 2025 Posters, to appear. (*These authors contributed equally to this work.)

Mr. Gomi (D2) and our collaborator Dr. Takeuchi presented the following papers at the Radiation and Its Effects on Components and Systems Conference (RADECS 2025), held in Antwerp, Belgium, from September 29 to October 3, 2025 (presentation dates: September 30 and October 3, respectively).

• Y. Gomi, K. Takami, R. Yasuda, H. Kanda, M. Fukuda, and M. Hashimoto, “Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs,” Radiation and Its Effects on Components and Systems Conference (RADECS), 2025.
• K. Takeuchi and M. Hashimoto, “Sensitive Volume Allocation Aligned with a Physics-Based Analytical Cross Section Model for Monte Carlo-Based Proton-Induced SEU Simulation,” Radiation and Its Effects on Components and Systems Conference (RADECS), 2025.

Prof. Hashimoto presented the following paper at the IEEE International Test Conference (ITC 2025), held in San Diego, USA, from September 21 to 26, 2025 (presentation date: September 23).

Q. Cheng, H. Chi, C. Liang, Y. Chao, H. Zhang, Y. Liang, M. Zhang, W. Liao, J. Xiong, J. Liou, M. Hashimoto, and L. Lin, “Genshin: a Generalized Framework with Software-Hardware Co-Design and Pruned Fault Injection for Reliability Analysis,” Proceedings of International Test Conference (ITC), 2025.