Scientific Reports採録決定

新津先生の論文がScientific Reportsに採択されました。

Prof. Niitsu’s papers is accepted to Scientific Reports !

Shiori Imai, Haruki Homma, Kairi Takimoto, Mizuki Tanikawa, Jin Nakamura, Masaya, Kaneko, Yuya Osaki, Kiichi Niitsu, Cheng Yongzhi, Ashif Aminulloh Fathnan, Hiroki Wakatsuchi , “Design guidelines for the SPICE parameters of waveform-selective metasurfaces varying with the incident pulse width at a constant oscillation frequency”

IRPS 2023

Kazusa Takami gave a poster presentation at International Reliability Physics Symposium (IRPS) on March 29, held in Monterey CA, USA from March 26 to 30, 2023.

K. Takami, Y. Gomi, S. Abe, W. Liao, S. Manabe, T. Matsumoto, and M. Hashimoto, “Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons,” Proceedings of International Reliability Physics Symposium (IRPS), 2023.

ICMTS2023

Niiyama-kun (M1) presented his research at International Conference on Microelectronic Test Structures (ICMTS 2023) held at the University of Tokyo from March 27 to 30, 2023.

  • K. Niiyama, H. Awano, and T. Sato, “Introducing transfer learning framework on device modeling by machine learning,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), pp.158-163, March 2023.

ACM IUI 2023

Harimaya gave a poster presentation at 28th Annual Conference on Intelligent User Interfaces (ACM IUI) held in Sydney, Australia on March 26–31, 2023.

M. Harimaya, R. Shirai, and M. Hashimoto, “Toward Instant 3D Modeling: Highly Parallelizable Shape Reproduction Method for Soft Object Containing Numerous Tiny Position Trackers,”in Companion Proceedings of the 28th International Conference on Intelligent User Interfaces (IUI), pp. 130–133, March 2022.

Paper accepted: IEEE Access

The following paper is accepted by IEEE Access. This is a collaborative work with Tokyo Institute of Technology.

Á. L. García-Arias, Y. Okoshi, M. Hashimoto, M. Motomura and J. Yu, “Recurrent Residual Networks Contain Stronger Lottery Tickets,” in IEEE Access, doi: 10.1109/ACCESS.2023.3245808.