IEICE Trans. Fundamentals Paper Accepted

The paper below has been accepted for publication.

Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto, “Vulnerability Estimation of DNN Model Parameters with Few Fault Injections,” IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, early access.
DOI:10.1587/transfun.2022VLP0004

SASIMI2022

Hitotsuyanagi and Segawa gave poster presentations at the Workshop on Synthesis And System Integration of Mixed Information Technologies (SASIMI2022) held in Hirosaki, Japan on October 24-25, 2022, (Hitotsuyanagi presented on 24th and Segawa on 25th).

  • Y. Hitotsuyanagi and T. Sato, “SNRoverSDNN: A Metric for robust CNN-based ROI selection in remote heart rate extraction,” in Proc. Workshop on synthesis and system integration of mixed information technologies (SASIMI), pp.8-13, October 2022.
  • N. Segawa and T. Sato, “Evaluating accuracy of quantum circuit learning via quantum circuit mapping,” in Proc. Workshop on synthesis and system integration of mixed information technologies (SASIMI), pp.204-209, October 2022.

SSDM2022

We presented two papers at SSDM2022 (International Conference on Solid State Devices and Materials 2020) held on September 26-29, 2022 (both presentations were made on September 28). These are the results of joint research with AIST.

  • Y. Ogasahara, K. Kuribara, and T. Sato, “Feasibility of the efficient OTFT array measurement for the long-term reliability evaluation using external measurement board,” in Proc. International Conference on Solid State Devices and Materials (SSDM), pp.273-274, September 2022.
  • Y. Kaneiwa, K. Kuribara, and T. Sato, “Aging-robust amplifier design using low voltage organic semiconductor loads,” in Proc. International Conference on Solid State Devices and Materials (SSDM), pp.259-260, September 2022.

ITC-Asia 2022

Prof. Hashimoto gave a keynote talk at International Test Conference in Asia (ITC-Asia) held in Taipei, Taiwan on August 24 – 36, 2022. Unfortunately, the talk was given online on August 25.

“Toward Correct Understanding and Characterization of Cosmic Ray-induced Soft Errors”