The following paper has been accepted for presentation at the IEEE International Conference on Microelectronic Test Structures (ICMTS), to be held in Edinburgh, Scotland, UK, in April 2024. This work is the result of joint research with Kyoto Institute of Technology.
- Michihiro Shintani, Tetsuro Iwasaki, and Takashi Sato, “Gaussian process-based device model toward a unified current model across room to cryogenic temperatures,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), April 2024. (to appear)
