LSI and Systems Workshop Best Poster Award (Student Category)

U4の稲田くん、北池くん、田川くん、寺内くん、長井くんがLSIとシステムのワークショップにおいて最優秀ポスター賞(学生部門)を受賞しました。

U4 Inada -Kun, Kitaike-Kun, Tagawa-Kun, Yerauchi-Kun, Nagai-Kun has received the Best Poster Award (Student Category) at the LSI and Systems Workshop !

最優秀ポスター賞(学生部門)『バイオ医療IoTに向けた分解能・サイズ・電力スケーラブルなサブテラヘルツ帯ラベルフリー3次元センサアレイの12nmFinFET/22nmCMOSでの理論的・実験的検証』

Paper accepted at IOLTS 2023

The following paper has been accepted for IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) to be held in Chania (Crete), Greece, in July 2023.

R. Iwamoto and M. Hashimoto, “Avoiding Soft Error-Induced Illegal Memory Accesses in GPU with Inter-Thread Communication,” Proceedings of International Symposium on On-Line Testing and Robust System Design (IOLTS), to appear.

(日本語) FLEPS2023 採択決定

The following paper has been accepted for the IEEE International Conference on Flexible, Printable Sensors and Systems (FLEPS 2023) to be held in Boston, USA, in July 2023. This research results from joint research with the National Institute of Advanced Industrial Science and Technology (AIST).

Qin Zhaoxing, Kunihiro Oshima, Kazunori Kuribara, and Takashi Sato, “OPTL: Robust and area-efficient pass gate logic for organic transistors,” in Proc. IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS), to appear.

Scientific Reports採録決定

新津先生の論文がScientific Reportsに採択されました。

Prof. Niitsu’s papers is accepted to Scientific Reports !

Shiori Imai, Haruki Homma, Kairi Takimoto, Mizuki Tanikawa, Jin Nakamura, Masaya, Kaneko, Yuya Osaki, Kiichi Niitsu, Cheng Yongzhi, Ashif Aminulloh Fathnan, Hiroki Wakatsuchi , “Design guidelines for the SPICE parameters of waveform-selective metasurfaces varying with the incident pulse width at a constant oscillation frequency”

IRPS 2023

Kazusa Takami gave a poster presentation at International Reliability Physics Symposium (IRPS) on March 29, held in Monterey CA, USA from March 26 to 30, 2023.

K. Takami, Y. Gomi, S. Abe, W. Liao, S. Manabe, T. Matsumoto, and M. Hashimoto, “Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons,” Proceedings of International Reliability Physics Symposium (IRPS), 2023.