Japanese Journal of Applied Physics (JJAP)へ以下の論文が採録されました．
本研究は産業技術総合研究所との共同研究によるものです．
- Yasuhiro Ogasahara, Kazunori Kuribara, Kunihiro Oshima, Zhaoxing Qin, and Takashi Sato, “Yield and Leakage Current of Organic Thin-Film Transistor Logic Gates toward Reliable and Low-Power Operation of Large-Scale Logic Circuits for IoT Nodes,” Japanese Journal of Applied Physics (JJAP), Vol.61, December 2021. doi:10.35848/1347-4065/ac44cf
