IEEE Journal of Solid-State Circuits に以下の論文が採録されました。
- Kunyang Liu, Zihan Fu, Gen Li, Hongliang Pu, Zhibo Guan, Xingyu Wang, Shufan Xu, Kiichi Niitsu, and Hirofumi Shinohara, “A Physically Unclonable Function With Less Than 4.16E–7 BER Featuring Secure In-Cell HCI Burn-In and nMOS-Dominant PUF Data Generation,” IEEE Journal of Solid-State Circuits, doi: 10.1109/JSSC.2026.3663657.
