以下の論文が2022年3月に開催予定の国際会議 IRPS2022 (IEEE International Reliability Physics Symposium 2022) に採択されました．
- Masato Shiozaki and Takashi Sato, “Characteristic degradation of power MOSFETs by X-ray irradiation and its recovery,” in Proc. IEEE International Reliability Physics Symposium (IRPS), April 2022. (accepted for presentation)
