投稿者: users

2025年1月20日から1月23日に日本科学未来館で開催されたAsia and South Pacific Design Automation Conference (ASP-DAC 2025)において、以下のメンバーが研究成果の発表を行いました。

• Masanori Hashimoto, Ryuichi Yasuda, Kazusa Takami, Yuibi Gomi, Kozo Takeuchi, “ML-assisted SRAM Soft Error Rate Characterization: Opportunities and Challenges,” in Proc. ACM/IEEE Asia and South Pacific Design Automation Conference (ASPDAC), pp.379-384, January 2025.
• Tomonari Tanaka, Takumi Uezono, Kohei Suenaga, Masanori Hashimoto, “Hardware Error Detection with In-Situ Monitoring of Control Flow-Related Specifications,” in Proc. ACM/IEEE Asia and South Pacific Design Automation Conference (ASPDAC), pp.966-973, January 2025.
• Takuma Kawakami, Takashi Sato, Hiromitsu Awano, “Random Telegraph Noise Observed on 65-nm Bulk pMOS Transistors at 3.8K,” in Proc. ACM/IEEE Asia and South Pacific Design Automation Conference (ASPDAC), pp.1438-1443, January 2025.

付随して開催されたWork-in-Progressセッションにおいて以下のポスター発表を行いました。

• Masami Utsunomiya, Hiroya Murata, Hiromitsu Awano, Takashi Sato, “Hardware Reservoir Using Transistor Variation Based on a 180nm Node Prototype Chip.”
• Wakahiro Oh, Takashi Sato, Hiromitsu Awano, “Cryo-CMOS Surface Code Decoder for Fault-Tolerant Quantum Computers.”
• Ryuichi Yasuda, Kazusa Takami, Yuibi Gomi, Kozo Takeuchi, Masanori Hashimoto, “Event-Wise Accurate Single-Event Upset Discrimination with Active Learning and Adaptive Hyperparameter Tuning.”

1件目の発表がPoster Awardを、2件目の発表がBest Poster Awardを受賞しました。